Journal Article

FZJ-2016-07523

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png FEI Titan G2 80-200 CREWLEY

Kovács, A. (Corresponding author)FZJ* ; Schierholz, R.FZJ* ; Tillmann, K.FZJ*

2016
Forschungszentrum Jülich Jülich

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Please use a persistent id in citations: http://hdl.handle.net/2128/13207  doi:10.17815/jlsrf-2-68

Abstract: The FEI Titan G2 80-200 CREWLEY is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale of both the structure and chemical composition. For these purposes, the FEI Titan G2 80-200 CREWLEY is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), a Cs probe corrector (CEOS DCOR), an in-column Super-X energy dispersive X-ray spectros-copy (EDX) unit (ChemiSTEM technology), a post-column energy filter system (Gatan Enfinium ER 977) with dual electron energy-loss spectroscopy (EELS) option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. For data recording the microscope is equipped with an angular dark-field (ADF) scanning TEM (STEM) detector (Fischione Model 3000), on-axis triple BF, DF1, DF2 detectors, on-axis BF/DF Gatan detectors as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP-P). Typical examples of use and technical specifications for the instrument are given below.

Note: POF-III: Electrochemical Storage

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)
2. Grundlagen der Elektrochemie (IEK-9)

Research Program(s):

1. 131 - Electrochemical Storage (POF3-131) (POF3-131)

Appears in the scientific report 2016

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