Hauptseite > Publikationsdatenbank > High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated by In Situ TEM and X-ray Diffraction |
Journal Article/Contribution to a conference proceedings | FZJ-2017-01398 |
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2016
Cambridge University Press
New York, NY
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Please use a persistent id in citations: http://hdl.handle.net/2128/19362 doi:10.1017/S1431927616008758
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