ER-C-2

Materialwissenschaft u. Werkstofftechnik Andere Formen:ER-C-2
IDI:(DE-Juel1)ER-C-2-20170209

ER-C

Recent Publications

All known publications ...
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Passivating Contacts‐Related Ultraviolet‐Induced Degradation in Silicon Heterojunction Solar Cells
Small structures 7(6), e202600024 () [10.1002/sstr.202600024] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Local Electrical Resistance and Electrochemical Impedance Response of a Proton Exchange Membrane Electrolyzer Anode
Chemistry of materials -(8), 3991 - 3998 () [10.1021/acs.chemmater.5c02979] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Influence of the layer orientation and the binder system on the mechanical behavior of titanium components manufactured by Metal Fused Filament Fabrication (MF3)
Materials science & engineering / A 975, 150905 - () [10.1016/j.msea.2026.150905] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Atomic Resolution in Near-Edge Core-Loss Mapping Beyond the Conventional Delocalization Limit
Physical review letters 137(5), 056402 () [10.1103/9y69-62kf] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Redefining plasticity in a cubic intermetallic: Dislocation dynamics in the CaAl2 Laves phase
Acta materialia 303, 121604 - () [10.1016/j.actamat.2025.121604] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Model for Imaging in High-Resolution Secondary Electron Microscopy
Microscopy and microanalysis 32(3), ozag038 () [10.1093/mam/ozag038]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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XAFS and DFT Insights into the Kinetics and Mechanisms of Technetium Reduction by Nanoparticulate Magnetite
Environmental science & technology 60(26), 18844 - 18853 () [10.1021/acs.est.6c01654] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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LiberTEM/LiberTEM-live: 0.3.0
[10.5281/ZENODO.20323918] BibTeX | EndNote: XML, Text | RIS

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LiberTEM/LiberTEM: 0.16.0
[10.5281/ZENODO.20283773] BibTeX | EndNote: XML, Text | RIS

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Reduced Variability in Threshold Switches Using Heterostructures of SiO x and Vertically Aligned MoS 2
Advanced electronic materials 12(7), e00800 () [10.1002/aelm.202500800] OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

All known publications ...
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 Datensatz erzeugt am 2017-02-09, letzte Änderung am 2023-03-13



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