Journal Article

FZJ-2017-01831

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Energy Level Alignment at the Fullerene/Titanium Oxide Ultrathin Film Interface

Paßens, M.FZJ* ; Moors, M.FZJ* ; Karthäuser, S. (Corresponding author)FZJ* ; Waser, R.FZJ*

2017
Soc. Washington, DC

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Please use a persistent id in citations: doi:10.1021/acs.jpcc.6b11386

Abstract: The performance of molecule based electronic devices can be improved by use of transition metal oxides (TMO) as charge injection buffer layers between electrodes and organic semiconductors. It is known that the appropriate energy level alignment at the molecule/TMO interface determines the efficiency of the respective TMO. Herein, scanning tunneling microscopy is employed to characterize the interface formed by fullerenes (C60) deposited on a titanium oxide (TiO) ultrathin film, which is created by oxidation of a Pt3Ti(111) surface. Individual C60 are identified with orbital resolution, and the interfacial and intermolecular interactions are characterized in detail. Furthermore, the energy level alignment at the C60/TiO ultrathin film interface is deduced based on scanning tunneling spectroscopy data. The results demonstrate that the C60/TiO interface corresponds to a type-I heterojunction and, thus, is useful to decouple C60 molecules from the metallic alloy surface.

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 524 - Controlling Collective States (POF3-524) (POF3-524)

Appears in the scientific report 2017

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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