TEM Analysis of Recrystallized DoubleFforged Tungsten After Exposure in JUDITH 1 and JUDITH 2

Van Renterghem, W.; Uytdenhouwen, I.; Wirtz, M.; Loewenhoff, Th.

doi:10.1016/j.nme.2016.04.003

Journal Article

FZJ-2017-06001

TEM Analysis of Recrystallized DoubleFforged Tungsten After Exposure in JUDITH 1 and JUDITH 2

Van Renterghem, W. (Corresponding author) ; Uytdenhouwen, I.FZJ* ; Loewenhoff, T.FZJ* ; Wirtz, M.FZJ*

2016
Elsevier Amsterdam [u.a.]

Nuclear materials and energy 9, 484 - 489 (2016) [10.1016/j.nme.2016.04.003]

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Please use a persistent id in citations: http://hdl.handle.net/2128/15155 doi:10.1016/j.nme.2016.04.003

Abstract: Five samples of recrystallized pure tungsten were exposed to transient heat loads using the electron beam of the JUDITH 1 and JUDITH 2 installations of Forschungszentrum Jülich. The heat flux and base temperature were the same for all samples; only the number of pulses and exposure device differed. Transmission electron microscopy was applied to determine the first defects that are introduced during exposure and to compare the effects of the two machines. With increasing number of pulses, first dislocations are formed near the grain boundaries, and then line dislocations and clusters of dislocations appear within the grains. Upon prolonged exposure, the dislocations migrate and cluster in dislocation pile-ups. Comparing exposure in JUDITH 1 to JUDITH 2, the amount of defects is much higher in the samples exposed in JUDITH 1.

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