Tunnelling junctions with additional degrees of freedom: An extended toolbox of scanning probe microscopy

Wagner, Christian; Temirov, Ruslan

doi:10.1016/j.progsurf.2015.01.001

Journal Article

FZJ-2018-01176

Tunnelling junctions with additional degrees of freedom: An extended toolbox of scanning probe microscopy

Wagner, C.FZJ* ; Temirov, R. (Corresponding author)FZJ*

2015
Elsevier Amsterdam [u.a.]

Progress in surface science 90(2), 194 - 222 (2015) [10.1016/j.progsurf.2015.01.001]

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Abstract: Considering studies of molecular adsorption we review recent developments in the field of scanning probe microscopy and in particular in scanning tunnelling microscopy, concentrating on the progress that has been achieved by controlled decoration of the microscope tip. A view is presented according to which the tip decoration generally introduces additional degrees of freedom into the scanning junction and thus extends its functionality. In particular tips decorated with atomic point-like particles may attain the additional function of a force sensor which is realized through the degrees of freedom associated with the relative position of the decorating probe-particle with respect to the tip. It is shown how the force sensor function of such tips helps when studying large molecular adsorbates. Further prospects of more complex junctions equipped with numerous internal degrees of freedom are discussed. It is argued that the main problem impeding the utilization of such junctions is related to their control. An approach towards a higher degree of control is presented that is based on the analysis of single molecule manipulation experiments.

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