Journal Article

FZJ-2018-01393

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Facile, non-destructive characterization of 2d photonic crystals using UV-vis-spectroscopy

Schöps, V.FZJ* ; Huhn, T. ; Boneberg, J. ; Scheer, E. ; Offenhäusser, A.FZJ* ; Mayer, D. (Corresponding author)FZJ* ; Lenyk, B.FZJ*

2018
RSC Publ. Cambridge

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Please use a persistent id in citations: doi:10.1039/C7CP07498K

Abstract: We present a simple and non-destructive method for characterizing and quantifying the quality of two-dimensional (2D) close-packed arrays of submicron dielectric spheres. Utilizing radiative losses of photonic modes created by the 2D crystals into dielectric substrates we are able to monitor the quality of the particle monolayer during assembly and the size evolution of the individual particles during dry etching. Using an advanced interfacial assembly technique we prepare particle monolayers on glass and characterize the spectral behaviour of the radiative loss regarding different lattice constants, dielectric substrates and layer qualities. The effect of diameter reduction during dry etching is analysed and a simple model is proposed, which enables non-destructive, on spot characterization of the particle layer with sub-20 nm resolution using UV-vis spectroscopy.

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Contributing Institute(s):

1. Bioelektronik (ICS-8)

Research Program(s):

1. 523 - Controlling Configuration-Based Phenomena (POF3-523) (POF3-523)

Appears in the scientific report 2018

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Database coverage:
; Allianz-Lizenz / DFG ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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