http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
de la Pena, F. ; Ostasevicius, T. ; Tonaas Fauske, V. ; Burdet, P. ; Jokubauskas, P. ; Nord, M. ; Sarahan, M. ; Prestat, E. ; Johnstone, D. N. ; Taillon, J. ; Caron, J.FZJ* ; Furnival, T. ; MacArthur, K.FZJ* ; Eljarrat, A. ; Mazzucco, S. ; Migunov, V.FZJ* ; Aarholt, T. ; Walls, M. ; Winkler, F.FZJ* ; Donval, G. ; Martineau, B. ; Garmannslund, A. ; Zagonel, L.-F. ; Iyengar, I.
2017
Cambridge University Press
New York, NY
This record in other databases:
Please use a persistent id in citations: doi:10.1017/S1431927617001751
Contributing Institute(s):
- Materialwissenschaft u. Werkstofftechnik (ER-C-2)
Research Program(s):
- 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
Appears in the scientific report
2018
Database coverage:
; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz

; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection