TY  - JOUR
AU  - Zheng, Fengshan
AU  - Caron, Jan
AU  - Migunov, Vadim
AU  - Beleggia, Marco
AU  - Pozzi, Giulio
AU  - Dunin-Borkowski, Rafal E.
TI  - Measurement of charge density in nanoscale materials using off-axis electron holography
JO  - Journal of electron spectroscopy and related phenomena
VL  - 241
SN  - 0368-2048
CY  - New York, NY [u.a.]
PB  - Elsevier
M1  - FZJ-2018-05151
SP  - 146881
PY  - 2020
AB  - Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000540723700015
DO  - DOI:10.1016/j.elspec.2019.07.002
UR  - https://juser.fz-juelich.de/record/851525
ER  -