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@ARTICLE{Horst:859059,
author = {Horst, Fabian and Farokhnejad, Atieh and Zhao, Qing-Tai and
Iniguez, Benjamin and Kloes, Alexander},
title = {2-{D} {P}hysics-{B}ased {C}ompact {DC} {M}odeling of
{D}ouble-{G}ate {T}unnel-{FET}s},
journal = {IEEE transactions on electron devices},
volume = {66},
number = {1},
issn = {1557-9646},
address = {New York, NY},
publisher = {IEEE},
reportid = {FZJ-2019-00010},
pages = {132-138},
year = {2019},
abstract = {This paper presents the derivation of a compact dc modeling
approach for the band-to-band tunneling current in
double-gate tunnel-field effect transistors (TFETs). The
physics-based model equations are solved in closed form by
including 2-D effects and are implemented in the hardware
description language Verilog-A. The verification of the
model is done in two steps. First, the modeling approach is
verified by TCAD Sentaurus simulation data of the band
diagram, the transfer current, and the output current
characteristics as well as the output conductance. The
modeling results show a good agreement with the TCAD data.
Then, measurement data of complementary nanowire
gate-all-around TFET devices are utilized to verify the
model and to show possible fields of application. As a part
of the verification, the benefits and limitations are
analyzed and discussed. The numerical stability and
flexibility of the model are pointed out by performing
simulations of a single-stage TFET inverter.},
cin = {PGI-9},
ddc = {620},
cid = {I:(DE-Juel1)PGI-9-20110106},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000454333500017},
doi = {10.1109/TED.2018.2856891},
url = {https://juser.fz-juelich.de/record/859059},
}