guest ::
| Home > Authorities > Periodicals > Nanomanufacturing and metrology |
| Home > Authorities > Periodicals > Nanomanufacturing and metrology |
|
|
| Common abbreviations:Nanomanuf Metrol [iso] Nanomanuf Metrol [dnlm] Nanomanuf Metrol [iso] | |
|
|
| Type: | journal |
| DDC: | 620 |
| Keywords(s): | Mechanical Engineering, Materials Science (miscellaneous), Industrial and Manufacturing Engineering |
| ISSN(s): | 2520-811X, 2520-8128 |
| Publisher: | Springer Singapore : [Singapore] [2017]- |
| Country: | Singapore |
| Appears: | print, online |
| ID: | PERI:(DE-600)2918284-0 |
Database coverage:
; DEAL Springer ; DEAL Springer ; Ebsco Academic Search ; SCOPUS
All known publications ...
Download: BibTeX | EndNote XML, Text | RIS |
Journal Article
DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
Nanomanufacturing and metrology 5(2), 101 - 111 (2022) [10.1007/s41871-022-00137-7]
Files Fulltext by OpenAccess repository
BibTeX |
EndNote:
XML,
Text |
RIS
All known publications ...
Download: BibTeX | EndNote XML, Text | RIS |