Home > Publications database > Standing-Wave and Resonant Soft- and Hard-X-ray Photoelectron Spectroscopy of Oxide Interfaces |
Review/Book | FZJ-2019-00553 |
; ; ; ;
2018
Springer International Publishing
Cham
ISBN: 978-3-319-74988-4 (print), 978-3-319-74989-1 (electronic)
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Please use a persistent id in citations: doi:10.1007/978-3-319-74989-1_7
Abstract: We discuss several new directions in photoemission that permit more quantitatively studying buried interfaces: going to higher energies in the multi-keV regime; using standing-wave excitation, created by reflection from either a multilayer heterostructure or atomic planes; tuning the photon energy to specific points near absorption resonances; and making use of near-total-reflection geometries. Applications to a variety of oxide and spintronic systems are discussed.
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