Hauptseite > Publikationsdatenbank > The Use of Annular Dark-Field Scanning Transmission Electron Microscopy for Quantitative Characterisation |
Journal Article | FZJ-2019-01291 |
2016
Johnson Matthey Plc
London
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Please use a persistent id in citations: http://hdl.handle.net/2128/21566 doi:10.1595/205651316X691186
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