Journal Article

FZJ-2020-02030

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Direct measurement of electrostatic potentials at the atomic scale: A conceptual comparison between electron holography and scanning transmission electron microscopy

Winkler, F. (Corresponding author)FZJ* ; Barthel, J.FZJ* ; Dunin-Borkowski, R. E.FZJ* ; Müller-Caspary, K.FZJ*

2020
Elsevier Science Amsterdam

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Please use a persistent id in citations: http://hdl.handle.net/2128/25716  doi:10.1016/j.ultramic.2019.112926

Abstract: Off-axis electron holography and first moment STEM are sensitive to electromagnetic potentials or fields, respectively. In this work, we investigate in what sense the results obtained from both techniques are equivalent and work out the major differences. The analysis is focused on electrostatic (Coulomb) potentials at atomic spatial resolution. It is shown that the probe-forming/objective aperture strongly affects the reconstructed electrostatic potentials and that, as a result of the different illumination setups, dynamical diffraction effects show a specific response with increasing specimen thickness. It is shown that thermal diffuse scattering is negligible for a wide range of specimen thicknesses, when evaluating the first moment of diffraction patterns.

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
2. Mikrostrukturforschung (PGI-5)
3. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
2. 144 - Controlling Collective States (POF3-144) (POF3-144)
3. 131 - Electrochemical Storage (POF3-131) (POF3-131)
4. moreSTEM - Momentum-resolved Scanning Transmission Electron Microscopy (VH-NG-1317) (VH-NG-1317)

Appears in the scientific report 2020

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