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| Hauptseite > Publikationsdatenbank > Temporally resolved LEIS measurements of Cr segregation after preferential sputtering of WCrY alloy |
| Hauptseite > Publikationsdatenbank > Temporally resolved LEIS measurements of Cr segregation after preferential sputtering of WCrY alloy |
| Journal Article | FZJ-2020-02311 |
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2020
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: http://hdl.handle.net/2128/25217 doi:10.1016/j.nimb.2020.06.005
Abstract: The dynamic behaviour of thermally driven segregation of Cr to the surface of WCrY smart alloy is studied with low energy ion scattering (LEIS). Sputtering the WCrY sample with 500 eV ions at room temperature results in preferential removal of the lighter alloy constituents and causes an almost pure W surface layer. At elevated temperatures above 700 K the segregation of Cr atoms towards the surface sets in and prevents the formation of a pure W layer. The simultaneous heating and sputtering of the sample leads to a surface state which reflects the balance between sputter removal and segregation flux, and deviates from the equilibrium due to thermally driven segregation. Stopping the sputter ion beam allows the system to relax and develop toward the segregation equilibrium. The time constants for the temporal changes of W and Cr surface coverage are obtained from a series of LEIS measurements. The segregation enthalpy is determined from the time constants obtained for various sample temperatures.
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