Journal Article FZJ-2020-02974

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Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities

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2019
Elsevier Science Amsterdam

Ultramicroscopy 203, 105 - 118 () [10.1016/j.ultramic.2019.01.008]

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Abstract: Off-axis electron holography has evolved into a powerful electron-microscopy-based technique for characterizing electromagnetic fields with nanometer-scale resolution. In this paper, we present a review of the application of off-axis electron holography to the quantitative measurement of electrostatic potentials and charge density distributions. We begin with a short overview of the theoretical and experimental basis of the technique. Practical aspects of phase imaging, sample preparation and microscope operation are outlined briefly. Applications of off-axis electron holography to a wide range of materials are then described in more detail. Finally, challenges and future opportunities for electron holography investigations of electrostatic fields and charge density distributions are presented.

Classification:

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
  2. DFG project 167917811 - SFB 917: Resistiv schaltende Chalkogenide für zukünftige Elektronikanwendungen: Struktur, Kinetik und Bauelementskalierung "Nanoswitches" (167917811) (167917811)
  3. SIMDALEE2 - Sources, Interaction with Matter, Detection and Analysis ofLow Energy Electrons 2 (606988) (606988)
  4. Q-SORT - QUANTUM SORTER (766970) (766970)

Appears in the scientific report 2020
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 Record created 2020-08-28, last modified 2023-05-05


Published on 2019-02-10. Available in OpenAccess from 2021-02-10.:
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