Home > Publications database > Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities |
Journal Article | FZJ-2020-02974 |
; ;
2019
Elsevier Science
Amsterdam
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Please use a persistent id in citations: http://hdl.handle.net/2128/27116 doi:10.1016/j.ultramic.2019.01.008
Abstract: Off-axis electron holography has evolved into a powerful electron-microscopy-based technique for characterizing electromagnetic fields with nanometer-scale resolution. In this paper, we present a review of the application of off-axis electron holography to the quantitative measurement of electrostatic potentials and charge density distributions. We begin with a short overview of the theoretical and experimental basis of the technique. Practical aspects of phase imaging, sample preparation and microscope operation are outlined briefly. Applications of off-axis electron holography to a wide range of materials are then described in more detail. Finally, challenges and future opportunities for electron holography investigations of electrostatic fields and charge density distributions are presented.
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