Gast ::
| Hauptseite > Publikationsdatenbank > Investigation of Electron and Hole Charge Trapping in LaLuO3 Stack MOS Capacitor Using the Three-Pulse CV Technique |
| Hauptseite > Publikationsdatenbank > Investigation of Electron and Hole Charge Trapping in LaLuO3 Stack MOS Capacitor Using the Three-Pulse CV Technique |
| Contribution to a book | FZJ-2020-03653 |
; ; ; ;
2011
Electrochemical Society (ECS)
Pennington, NJ
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