Contribution to a book

FZJ-2020-03659

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Rare-Earth Metal Scandate High-k Layers

Zhao, C. ; Heeg, T.FZJ* ; Wagner, M.FZJ* ; Schubert, J.FZJ* ; Witters, T. ; Brijs, B. ; Bender, H. ; Richard, O. ; Afanas'ev, V. V. ; Houssa, M. ; Caymax, M. ; De Gendt, S.

2006
Electrochemical Society (ECS) Pennington, NJ

This record in other databases:  

Please use a persistent id in citations: doi:10.1149/1.2209266

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Halbleiterschichten und Bauelemente (ISG-1)
2. Center of Nanoelectronic Systems for Information Technology (CNI)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2006

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