Contribution to a book

FZJ-2020-03709

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png (Invited) Failure Mechanisms in AlGaN/GaN HEMTs Irradiated with 2MeV Protons

Anderson, T. J. ; Koehler, A. D. ; Specht, P. ; Weaver, B. D. ; Greenlee, J. D. ; Tadjer, M. J. ; Hite, J. K. ; Mastro, M. A. ; Porter, M. ; Wade, M. ; Dubon, O. ; Luysberg, M.FZJ* ; Hobart, K. D. ; Weatherford, T. R. ; Kub, F. J.

2015
Electrochemical Society (ECS) Pennington, NJ

This record in other databases:

Please use a persistent id in citations: doi:10.1149/06601.0015ecst

---

Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2015

---

Database coverage:
; SCOPUS

---