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Conference Presentation (After Call) FZJ-2021-04975
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Impact of the Backgate on the Performance of SOI UTBB nMOSFETs at Cryogenic Temperatures

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2021

Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon, VirtualVirtual, France, 1 Sep 2021 - 3 Sep 20212021-09-012021-09-03

Contributing Institute(s):
  1. Halbleiter-Nanoelektronik (PGI-9)
Research Program(s):
  1. 5234 - Emerging NC Architectures (POF4-523) (POF4-523)

Appears in the scientific report 2021
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Document types > Presentations > Conference Presentations
Institute Collections > PGI > PGI-9
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Publications database
 Record created 2021-12-06, last modified 2021-12-08
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