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Effect of lattice excitations on transient near-edge x-ray absorption spectroscopy
Rothenbach, N. (Corresponding author) ; Gruner, M. E. ; Ollefs, K. ; Schmitz-Antoniak, C.FZJ* ; Salamon, S. ; Zhou, P. ; Li, R. ; Mo, M. ; Park, S.FZJ* ; Shen, X. ; Weathersby, S. ; Yang, J. ; Wang, X. J. ; Šipr, O. ; Ebert, H.FZJ* ; Sokolowski-Tinten, K. ; Pentcheva, R. ; Bovensiepen, U. ; Eschenlohr, A. ; Wende, H.
2021
Inst.
Woodbury, NY
This record in other databases:
Please use a persistent id in citations: http://hdl.handle.net/2128/29803 doi:10.1103/PhysRevB.104.144302
Contributing Institute(s):
- Elektronische Eigenschaften (PGI-6)
Research Program(s):
- 5211 - Topological Matter (POF4-521) (POF4-521)
Appears in the scientific report
2021
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; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection