Home > Publications database > Spatially resolved electrical analysis of epitaxial defect-stabilized hafnium oxide thin films
 
Conference Presentation (Other) FZJ-2023-00708
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Spatially resolved electrical analysis of epitaxial defect-stabilized hafnium oxide thin films

 ;  ;  ;  ;  ;  ;  ;

2022

Materials Research Society Fall Meeting, BostonBoston, USA, 27 Nov 2022 - 2 Dec 20222022-11-272022-12-02

Contributing Institute(s):
  1. Elektronische Materialien (PGI-7)
  2. JARA-FIT (JARA-FIT)
  3. JARA Institut Green IT (PGI-10)
Research Program(s):
  1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)

Appears in the scientific report 2022
Click to display QR Code for this record

The record appears in these collections:
Document types > Presentations > Conference Presentations
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-10
Institute Collections > PGI > PGI-7
Workflow collections > Public records
Publications database
 Record created 2023-01-16, last modified 2023-01-23
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)
JuSER :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.7 | join2_v2510-2-gd5e4e3e
Maintained by juser@fz-juelich.de

Impressum | Data Privacy Policy
This site is also available in the following languages:
Deutsch  English