Journal Article

FZJ-2024-00528

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography

Ji, K.FZJ* ; Schnedler, M. (Corresponding author)FZJ* ; Lan, Q.FZJ* ; Zheng, F.FZJ* ; Wang, Y. X.FZJ* ; Lu, Y.FZJ* ; Eisele, H. ; Carlin, J.-F. ; Butté, R. ; Grandjean, N. ; Dunin-Borkowski, R. E.FZJ* ; Ebert, P.FZJ*

2024
IOP Publ. Bristol

This record in other databases:    

Please use a persistent id in citations: doi:10.35848/1882-0786/ad163d  doi:10.34734/FZJ-2024-00528

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)

Research Program(s):

1. 5353 - Understanding the Structural and Functional Behavior of Solid State Systems (POF4-535) (POF4-535)
2. DFG project 398305088 - Grundlegende Eigenschaften nicht-polarer Oberflächen von ternären Gruppe-III-Nitrid-Verbindungshalbleitern (398305088) (398305088)

Appears in the scientific report 2024

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Database coverage:
; ; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; DOAJ Seal ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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