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Confinement‐Induced Phonon Softening and Hardening in Sb 2 Te 3 Thin Films
Mertens, J. ; Kerres, P.FZJ* ; Xu, Y. ; Raghuwanshi, M. ; Kim, D. ; Schön, C.-F. ; Frank, J. ; Hoff, F. ; Zhou, Y. ; Mazzarello, R. ; Jalil, A. R.FZJ* ; Wuttig, M. (Corresponding author)FZJ*
2024
Wiley-VCH
Weinheim
This record in other databases:
Please use a persistent id in citations: doi:10.1002/adfm.202307681 doi:10.34734/FZJ-2024-00636
Contributing Institute(s):
- JARA Institut Green IT (PGI-10)
Research Program(s):
- 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
Appears in the scientific report
2024
Database coverage:
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; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 15 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection