Journal Article

FZJ-2024-01529

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Accurate Evaluation Method for HRS Retention of VCM ReRAM

Kopperberg, N. ; Wouters, D. J. ; Waser, R.FZJ* ; Menzel, S.FZJ* ; Wiefels, S. (Corresponding author)FZJ*

2024
AIP Publ. Melville, NY

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Please use a persistent id in citations: doi:10.1063/5.0188573  doi:10.34734/FZJ-2024-01529

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Contributing Institute(s):

1. Elektronische Materialien (PGI-7)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 5233 - Memristive Materials and Devices (POF4-523) (POF4-523)
2. BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) (BMBF-16ME0398K)

Appears in the scientific report 2024

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Database coverage:
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