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Fabrication of gate electrodes for scalable quantum computing using CMOS industry compatible e-beam lithography and numerical simulation of the resulting quantum device
Brackmann, V. ; Neul, M. ; Friedrich, M. ; Langheinrich, W. ; Simon, M. ; Muster, P. ; Pregl, S. ; Demmler, A. ; Hanisch, N. ; Lederer, M. ; Zimmermann, K. ; Klos, J.FZJ* ; Reichmann, F. ; Yamamoto, Y. ; Wislicenus, M. ; Dahl, C. ; Schreiber, L. R. (Corresponding author)FZJ* ; Bluhm, H.FZJ* ; Lilienthal-Uhlig, B. ; Behringer, U. F. (Editor) ; Loeschner, H. (Editor) ; Finders, J. (Editor)
2023
SPIE
202338th European Mask and Lithography Conference (EMLC 2023) : [Proceedings] - SPIE, 2023. - ISBN 97815106686079781510668614 - doi:10.1117/12.2675943
38th European Mask and Lithography Conference, DresdenDresden, Germany, 19 Jun 2023 - 21 Jun 20232023-06-192023-06-21
SPIE 1-10 (2023) [10.1117/12.2675943]2023
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Please use a persistent id in citations: doi:10.1117/12.2675943
Contributing Institute(s):
- JARA Institut Quanteninformation (PGI-11)
Research Program(s):
- 5221 - Advanced Solid-State Qubits and Qubit Systems (POF4-522) (POF4-522)
Appears in the scientific report
2024