Simultaneously measured signals in scanning probe microscopy with a needle sensor: Frequency shift and tunneling current

Morawski, I.; Voigtländer, B.

doi:10.1063/1.3321437

Journal Article

Simultaneously measured signals in scanning probe microscopy with a needle sensor: Frequency shift and tunneling current

Morawski, I.FZJ* ; Voigtländer, B.FZJ*

2010
American Institute of Physics [S.l.]

Review of scientific instruments 81, 033703 (2010) [10.1063/1.3321437]

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Please use a persistent id in citations: http://hdl.handle.net/2128/16758 doi:10.1063/1.3321437

Abstract: We present combined noncontact scanning force microscopy and tunneling current images of a platinum(111) surface obtained by means of a 1 MHz quartz needle sensor. The low-frequency circuit of the tunneling current was combined with a high-frequency signal of the quartz resonator enabling full electrical operation of the sensor. The frequency shift and the tunneling current were detected simultaneously, while the feedback control loop of the topography signal was fed using one of them. In both cases, the free signal that was not connected to the feedback loop reveals proportional-integral controller errorlike behavior, which is governed by the time derivative of the topography signal. A procedure is proposed for determining the mechanical oscillation amplitude by utilizing the tunneling current also including the average tip-sample work function.

Keyword(s): J ; atomic force microscopy (auto) ; sensors (auto) ; signal processing (auto)

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Note: Record converted from VDB: 12.11.2012

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