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| Hauptseite > Publikationsdatenbank > Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy |
| Hauptseite > Publikationsdatenbank > Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy |
| Contribution to a conference proceedings | FZJ-2024-06751 |
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2024
IEEE
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Please use a persistent id in citations: doi:10.1109/CVPRW63382.2024.00012 doi:10.34734/FZJ-2024-06751
Abstract: In this work, we explore the potential of self-supervised learning with Generative Adversarial Networks (GANs) for electron microscopy datasets. We show how self-supervised pretraining facilitates efficient fine-tuning for a spectrum of downstream tasks, including semantic segmentation, denoising, noise & background removal, and super-resolution. Experimentation with varying model complexities and receptive field sizes reveals the remarkable phenomenon that fine-tuned models of lower complexity consistently outperform more complex models with random weight initialization. We demonstrate the versatility of self-supervised pretraining across various downstream tasks in the context of electron microscopy, allowing faster convergence and better performance. We conclude that self-supervised pretraining serves as a powerful catalyst, being especially advantageous when limited annotated data are available and efficient scaling of computational cost is important.
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