Journal Article

PreJuSER-10394

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Adsorption-controlled growth of BiMnO3 thin films by molecular-beam epitaxy

Lee, J. H. ; Ke, X. ; Misra, R. ; Ihlefeld, J. F. ; Xu, X. S. ; Mei, Z. G. ; Heeg, T. ; Roeckerath, M.FZJ* ; Schubert, J.FZJ* ; Liu, Z. K. ; Musfeldt, J. L. ; Schiffer, P. ; Schlom, D. G.

2010
American Institute of Physics Melville, NY

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/18091  doi:10.1063/1.3457786

Abstract: We have developed the means to grow BiMnO3 thin films with unparalleled structural perfection by reactive molecular-beam epitaxy and determined its band gap. Film growth occurs in an adsorption-controlled growth regime. Within this growth window bounded by oxygen pressure and substrate temperature at a fixed bismuth overpressure, single-phase films of the metastable perovskite BiMnO3 may be grown by epitaxial stabilization. X-ray diffraction reveals phase-pure and epitaxial films with omega rocking curve full width at half maximum values as narrow as 11 arc sec (0.003 degrees). Optical absorption measurements reveal that BiMnO3 has a direct band gap of 1.1 +/- 0.1 eV. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3457786]

Keyword(s): J ; absorption coefficients (auto) ; bismuth compounds (auto) ; energy gap (auto) ; magnetic epitaxial layers (auto) ; molecular beam epitaxial growth (auto) ; multiferroics (auto) ; X-ray diffraction (auto)

Note: We gratefully acknowledge the financial support from the National Science Foundation through Grant No. DMR-0507146 and the MRSEC program (Grant No. DMR-0820404 ) and from the U.S. DOE through Grant No. DE-FG02-01-ER45885 (UT)

---

Contributing Institute(s):

1. Halbleiter-Nanoelektronik (IBN-1)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2010

---

Database coverage:

---