Journal Article

PreJuSER-10832

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Critical current diffraction pattern of SIFS Josephson junctions with a step-like F-layer

Weides, M.FZJ* ; Peralagu, U. ; Kohlstedt, H.FZJ* ; Pfeifer, J. ; Kemmler, M. ; Gürlich, C. ; Goldobin, E. ; Koelle, D. ; Kleiner, R.

2010
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/0953-2048/23/9/095007

Abstract: We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses d(1) and d(2) in both halves were varied to obtain different combinations of positive and negative critical current densities j(c), 1 and j(c), 2. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.

Keyword(s): J

Note: Support via DFG (SFB/TRR-21, WE 4359/1-1) and the AvH Foundation (MW) is gratefully acknowledged.

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Contributing Institute(s):

1. Elektronische Materialien (IFF-6)
2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2010

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