Journal Article

FZJ-2013-01818

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Annealing induced defects in SiC, SiO x single layers, and SiC/SiO x hetero-superlattices

Ding, K. (Corresponding author)FZJ* ; Aeberhard, U.FZJ* ; Beyer, W.FZJ* ; Astakhov, O.FZJ* ; Köhler, F.FZJ* ; Breuer, U.ZEA-3*FZJ* ; Finger, F.FZJ* ; Carius, R.FZJ* ; Rau, U.FZJ*

2012
Wiley-VCH Weinheim

This record in other databases:  

Please use a persistent id in citations: doi:10.1002/pssa.201200191

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2012

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Database coverage:
; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection ; Zoological Record

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