Journal Article

FZJ-2013-04947

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In-situ determination of the effective absorbance of thin μc-Si:H layers growing on rough ZnO:Al

Meier, M. (Corresponding author)FZJ* ; Bittkau, K.FZJ* ; Paetzold, U. W.FZJ* ; Hüpkes, J.FZJ* ; Muthmann, S.FZJ* ; Schmitz, R.FZJ* ; Mück, A.FZJ* ; Gordijn, A.FZJ*

2013
EDP Sciences Les Ulis

This record in other databases:

Please use a persistent id in citations: http://hdl.handle.net/2128/11506  doi:10.1051/epjpv/2013025

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Contributing Institute(s):

1. Photovoltaik (IEK-5)

Research Program(s):

1. 111 - Thin Film Photovoltaics (POF2-111) (POF2-111)

Appears in the scientific report 2013

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Database coverage:
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