Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Schaab, J.; Cano, A.; Krug, I. P.; Schneider, C. M.; Doğanay, H.; Gottlob, D. M.; Bourret, E.; Nickel, F.; Ramesh, R.; Meier, D.; Hentschel, M.; Yan, Z.

doi:10.1063/1.4879260

Journal Article

FZJ-2014-03510

Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Schaab, J. (Corresponding Author) ; Krug, I. P. ; Nickel, F. ; Gottlob, D. M. ; Doğanay, H.FZJ* ; Cano, A. ; Hentschel, M. ; Yan, Z. ; Bourret, E. ; Schneider, C. M.FZJ* ; Ramesh, R. ; Meier, D.

2014
American Institute of Physics Melville, NY

Applied physics letters 104(23), 232904 - (2014) [10.1063/1.4879260]

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Please use a persistent id in citations: http://hdl.handle.net/2128/17325 doi:10.1063/1.4879260

Abstract: High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established methodfor imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEMand demonstrate its capability for imaging and investigating domain walls in ferroelectrics withhigh spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls canbe visualized based on photo-induced charging effects and local variations in their electronicconductance can be mapped by analyzing the energy distribution of photoelectrons. Our resultsopen the door for non-destructive, contact-free, and element-specific studies of the electronicand chemical structure at domain walls in ferroelectrics.

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