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| Home > Publications database > Direct Evidence of the Temperature-Induced Molecular Reorientation in Tetracene Thin Films on AlO$_{x}$ /Ni $_{3}$ Al(111)422 |
| Journal Article | FZJ-2014-05602 |
; ; ; ;
2014
Soc.
Washington, DC
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Please use a persistent id in citations: doi:10.1021/jp507773f
Abstract: Control over the optical properties of the fluorescent organic layer plays a key role in the development of organic light-emitting diodes. A combination of near-edge X-ray absorption fine structure spectroscopy and X-ray photoelectron spectroscopy was used to study structural changes in thin films of tetracene on AlOx/Ni3Al(111). It is shown that upon deposition onto the cold (100 K) substrate, a monolayer of tetracene molecules adopts a disordered adsorption configuration with the molecular planes orientated almost parallel to the surface. Upon annealing at 280 K, the molecular packing changes and the tetracene units adopt a more upright orientation. The consequences of this orientational change for the luminescent properties of the molecular adlayer are discussed, in particular with regard to a quenching of the optical excitation by an electronic coupling of occupied and unoccupied molecular states to those of the metal substrate
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