Journal Article

FZJ-2015-00877

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope

Duchamp, M. (Corresponding Author)FZJ* ; Xu, Q. ; Dunin-Borkowski, R.FZJ*

2014
Cambridge University Press New York, NY

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Please use a persistent id in citations: doi:10.1017/S1431927614013476

Abstract: A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 42G - Peter Grünberg-Centre (PG-C) (POF2-42G41) (POF2-42G41)

Appears in the scientific report 2014

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Database coverage:
; Allianz-Lizenz / DFG ; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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