Journal Article

PreJuSER-22014

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation

Wiemann, C.FZJ* ; Patt, M.FZJ* ; Cramm, S.FZJ* ; Escher, M. ; Merkel, M. ; Gloskovskii, A. ; Thiess, S. ; Drube, W. ; Schneider, C. M.FZJ*

2012
Springer Berlin

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Please use a persistent id in citations: doi:10.1063/1.4722940

Abstract: We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA III storage ring facility using hard x-ray excitation up to 6.5 keV photon energy demonstrate that it is possible to obtain selected-area x-ray photoemission spectra from regions less than 500 nm in diameter. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4722940]

Keyword(s): J

Note: Thanks are due to Ch. Lenser for providing the STO sample. Financial support through the Deutsche Forschungsgemeinschaft within Sonderforschungsbereich 917 "Nanoswitches" is gratefully acknowledged.

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Contributing Institute(s):

1. Elektronische Eigenschaften (PGI-6)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2012

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Database coverage:
; Current Contents - Social and Behavioral Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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