Journal Article PreJuSER-2728

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Wedgelike ultrathin epitaxial BaTiO3 films for studies of scaling effects in ferroelectrics

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2008
American Institute of Physics Melville, NY

Applied physics letters 93, 072902 () [10.1063/1.2972135]

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Abstract: To study ferroelectric size effects in heteroepitaxial SrRuO3/BaTiO3/SrRuO3 capacitors, ultrathin BaTiO3 layers were deposited in wedge form across SrTiO3 substrates. The wedgelike films were fabricated by using either an off-center substrate-target geometry or via a moveable shutter during high-pressure sputter deposition. The crystallinity, composition, and surface roughness along wedgelike BaTiO3 films were verified by x-ray diffraction, Rutherford backscattering spectrometry, and atomic force microscopy, respectively. The electrical measurements performed at 77 K showed that, despite progressive reduction in remanent polarization as the film thickness decreases even the 3.5-nm-thick BaTiO3 film retains a large remanent polarization of 28 mu C/cm(2). (C) 2008 American Institute of Physics.

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Note: The authors wish to thank M. Hambe for helpful suggestions. The financial support of Hasylab through project II-05079 and the Deutsche Forschungsgemeinschaft under Grant No. KL 1021/4-1 and the Volkswagen-Stiftung within the program "Complex Materials: Cooperative Projects of the Natural, Engineering, and Biosciences" under the project I/77 737 entitled "Nano-sized ferroelectric Hybrids" is gratefully acknowledged.

Contributing Institute(s):
  1. Elektronische Materialien (IFF-6)
  2. Halbleiter-Nanoelektronik (IBN-1)
  3. Mikrostrukturforschung (IFF-8)
  4. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
Research Program(s):
  1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2008
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 Record created 2012-11-13, last modified 2024-06-10