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| Hauptseite > Publikationsdatenbank > Physics of the Switching Kinetics in Resistive Memories |
| Hauptseite > Publikationsdatenbank > Physics of the Switching Kinetics in Resistive Memories |
| Journal Article | FZJ-2016-00727 |
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2015
Wiley-VCH
Weinheim
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Please use a persistent id in citations: doi:10.1002/adfm.201500825
Abstract: Memristive cells based on different physical effects, that is, phase change, valence change, and electrochemical processes, are discussed with respect to their potential to overcome the voltage–time dilemma that is crucial for an application in storage devices. Strongly non-linear switching kinetics are required, spanning more than 15 orders of magnitude in time. Temperature-driven and field-driven crystallization, threshold switching, ion migration, as well as redox reactions at interfaces are identified as relevant mechanisms. In phase change materials the combination of a reversible threshold switching and extremely large crystal growth velocities at high voltages enables ultra-fast resistive switching whereas lower voltages will not be sufficient to overcome the energy barrier for crystallization. In electrochemical cells it depends on the voltage regime, which mechanism is the rate-determining one for switching. While electro-crystallization dominates at low voltages, electron transfer in the medium voltage range and a mixture of electron transfer and ion migration at high voltages. In valence change materials, ion migration is found to be accelerated by a combined effect of electric field and local temperature increase due to Joule heating. All discussed types of resistive switches can provide sufficient non-linearity of switching kinetics for overcoming the voltage time dilemma.
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