Journal Article

PreJuSER-53332

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Design and performance of a beetle-type double-tip scanning tunneling microscope

Jaschinsky, P.FZJ* ; Coenen, P.FZJ* ; Pirug, G.FZJ* ; Voigtländer, B.FZJ*

2006
American Institute of Physics [S.l.]

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Please use a persistent id in citations: http://hdl.handle.net/2128/2170  doi:10.1063/1.2336112

Abstract: A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip. (c) 2006 American Institute of Physics.

Keyword(s): J

Note: Record converted from VDB: 12.11.2012

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Contributing Institute(s):

1. Institut für Grenzflächen und Vakuumtechnologien (ISG-3)
2. Center of Nanoelectronic Systems for Information Technology (CNI)

Research Program(s):

1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2006
Notes: This version is available at the following Publisher URL: http://rsi.aip.org

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