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Journal Article | PreJuSER-5386 |
2009
Elsevier
[S.l.] @
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Please use a persistent id in citations: doi:10.1016/j.mee.2009.03.132
Abstract: The review provides a survey of non-volatile, highly scalable memory devices which are based on redox phenomena controlling the resistance of nanoscale memory cells. The classification of the memory effects, the understanding of the underlying mechanisms, and a sketch of the integration efforts will be presented. (C) 2009 Published by Elsevier B.V.
Keyword(s): J ; Resistive switching (auto) ; Non-volatile memories (auto) ; Electrochemical metallization (auto) ; Valence change (auto) ; Thermochemistry (auto)
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