Journal Article PreJuSER-5386

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Resistive non-volatile memory devices



2009
Elsevier [S.l.] @

Microelectronic engineering 86, () [10.1016/j.mee.2009.03.132]

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Abstract: The review provides a survey of non-volatile, highly scalable memory devices which are based on redox phenomena controlling the resistance of nanoscale memory cells. The classification of the memory effects, the understanding of the underlying mechanisms, and a sketch of the integration efforts will be presented. (C) 2009 Published by Elsevier B.V.

Keyword(s): J ; Resistive switching (auto) ; Non-volatile memories (auto) ; Electrochemical metallization (auto) ; Valence change (auto) ; Thermochemistry (auto)


Note: Record converted from VDB: 12.11.2012

Contributing Institute(s):
  1. Elektronische Materialien (IFF-6)
  2. Jülich-Aachen Research Alliance - Fundamentals of Future Information Technology (JARA-FIT)
Research Program(s):
  1. Grundlagen für zukünftige Informationstechnologien (P42)

Appears in the scientific report 2009
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Document types > Articles > Journal Article
JARA > JARA > JARA-JARA\-FIT
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 Record created 2012-11-13, last modified 2019-06-25



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