Composition influences on the electrical and electromechanical properties of lead zirconate titanate thin films

Gerber, P.; Böttger, U.; Waser, R.

doi:10.1063/1.2401047

Journal Article

PreJuSER-58105

Composition influences on the electrical and electromechanical properties of lead zirconate titanate thin films

Gerber, P. ; Böttger, U. ; Waser, R.FZJ*

2006
American Institute of Physics Melville, NY

Journal of applied physics 100, 124105-1 - 124105-8 (2006) [10.1063/1.2401047]

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Please use a persistent id in citations: http://hdl.handle.net/2128/17154 doi:10.1063/1.2401047

Abstract: The influences of the Zr content on the structural, electrical, and electromechanical properties of Pb[Zr-(x),Ti(1-x)]O-3 [PZT(x/1-x)] thin films are investigated in detail. Additionally to measuring all major characteristics of the samples, the electromechanical large-signal behavior is modeled. Raising the Zr content increases the unit cell size and forces the preferred phase to become rhombohedral above the morphotropic phase boundary (MPB). The increased unit cell size changes the switching behavior and increases the intrinsic behavior of the unit cells. The intrinsic behavior is reduced by the phase change, which also introduces non-180 degrees domain wall motion, improving the large-signal strain. Additionally, the domain configuration in saturation is more stable further away from the MPB. Finally, the most suitable materials will be selected for different applications. (c) 2006 American Institute of Physics.

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