Home > Publications database > Time-of-flight secondary ion mass spectrometry study of lithium intercalation process in LiCoO$_2$ thin film |
Journal Article | FZJ-2016-02540 |
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2016
Elsevier
New York, NY [u.a.]
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Please use a persistent id in citations: http://hdl.handle.net/2128/11201 doi:10.1016/j.jpowsour.2016.04.084
Abstract: A detailed time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of the lithium de-/intercalation in thin films of the insertion cathode material lithium cobalt oxide is presented. The LiCoO2 (LCO) thin films are deposited by radio frequency magnetron sputtering at 600 °C, having a (003) preferred orientation after the deposition. The thin electrode films are cycled with liquid electrolyte against lithium metal, showing 80-86% extractable capacities. After disassembling the cells, the depth resolved elemental distribution in the LCO is investigated by ToF-SIMS and glow discharge optical emission spectroscopy. Both techniques show a stepwise lithium distribution in charged state, leading to a lithium depleted layer close to the surface. In combination with the electrochemical results, the qualitative comparison of the different lithium depth profiles yields a reversible lithium extraction in the depleted area below the stability limit for bulk materials of LCO. For bulk LCO, a phase change normally occurs when the lithium concentration in LixCoO2 is lower than x=0.5. As a possible cause for the inhibition of the phase change, the preferred orientation and thus pinning of the crystal structure of the film by the substrate is proposed.
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