Journal Article

FZJ-2016-04036

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Scanning quantum dot microscopy: A quantitative method to measure local electrostatic potential near surfaces

Green, M. F. B. ; Wagner, C.FZJ* ; Leinen, P.FZJ* ; Deilmann, T. ; Krüger, P. ; Rohlfing, M. ; Tautz, F. S.FZJ* ; Temirov, R.FZJ*

2016
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.7567/JJAP.55.08NA04

Abstract: In this paper we review a recently introduced microscopy technique, scanning quantum dot microscopy (SQDM), which delivers quantitative maps of local electrostatic potential near surfaces in three dimensions. The key to achieving SQDM imaging is the functionalization of a scanning probe microscope tip with a π-conjugated molecule that acts as a gateable QD. Mapping of electrostatic potential with SQDM is performed by gating the QD by the bias voltage applied to the scanning probe microscope junction and registering changes of the QD charge state with frequency-modulated atomic force microscopy.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)
2. JARA-FIT (JARA-FIT)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)

Appears in the scientific report 2016

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Database coverage:
; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; No Authors Fulltext ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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