Journal Article

FZJ-2016-05156

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Local charge measurement using off-axis electron holography

Beleggia, M. (Corresponding author) ; Gontard, L. C. ; Dunin-Borkowski, R.FZJ*

2016
IOP Publ. Bristol

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Please use a persistent id in citations: http://hdl.handle.net/2128/14647  doi:10.1088/0022-3727/49/29/294003

Abstract: A model-independent approach based on Gauss' theorem for measuring the local charge in a specimen from an electron-optical phase image recorded using off-axis electron holography was recently proposed. Here, we show that such a charge measurement is reliable when it is applied to determine the total charge enclosed within an object. However, the situation is more complicated for a partial charge measurement when the integration domain encloses only part of the object. We analyze in detail the effects on charge measurement of the mean inner potential of the object, of the presence of induced charges on nearby supports/electrodes and of noise. We perform calculations for spherical particles and highlight the differences when dealing with other object shapes. Our analysis is tested using numerical simulations and applied to the interpretation of an experimental dataset recorded from a sapphire particle.

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Contributing Institute(s):

1. Mikrostrukturforschung (PGI-5)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017

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Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; National-Konsortium ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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