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Performance Benchmarking of p-type In0.65Ga0.35As/GaAs0.4Sb0.6 andGe/Ge0.93Sn0.07 Hetero-junction Tunnel FETs
Pandey, R. ; Schulte-Braucks, C.FZJ* ; Sajjad, R. N. ; Barth, M. ; Gosh, R. K. ; Grisafe, B. ; Sharma, P. ; von den Driesch, N.FZJ* ; Vohra, A. ; Rayner, B. ; Loo, R. ; Mantl, S.FZJ* ; Buca, D. M.FZJ* ; Yeh, C.-C. ; Wu, C.-H. ; Tsai, W. ; Antoniadis, D. ; Datta, S. (Corresponding author)
2016
20162016 IEEE International Electron Devices Meeting (IEDM), San FranciscoSan Francisco, USA, 5 Dec 2016 - 7 Dec 20162016-12-052016-12-07
19.6.1-19.6.4 (2016)2016
Contributing Institute(s):
- Halbleiter-Nanoelektronik (PGI-9)
- JARA-FIT (JARA-FIT)
Research Program(s):
- 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
- E2SWITCH - Energy Efficient Tunnel FET Switches and Circuits (619509) (619509)
Appears in the scientific report
2016
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