Contribution to a conference proceedings FZJ-2017-00086

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png
Performance Benchmarking of p-type In0.65Ga0.35As/GaAs0.4Sb0.6 andGe/Ge0.93Sn0.07 Hetero-junction Tunnel FETs

 ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;

2016

2016 IEEE International Electron Devices Meeting (IEDM), San FranciscoSan Francisco, USA, 5 Dec 2016 - 7 Dec 20162016-12-052016-12-07 19.6.1-19.6.4 ()


Contributing Institute(s):
  1. Halbleiter-Nanoelektronik (PGI-9)
  2. JARA-FIT (JARA-FIT)
Research Program(s):
  1. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)
  2. E2SWITCH - Energy Efficient Tunnel FET Switches and Circuits (619509) (619509)

Appears in the scientific report 2016
Database coverage:
No Authors Fulltext
Click to display QR Code for this record

The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
JARA > JARA > JARA-JARA\-FIT
Institute Collections > PGI > PGI-9
Workflow collections > Public records
Publications database

 Record created 2017-01-05, last modified 2021-01-29



Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)