Journal Article FZJ-2017-01344

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The microstructure of tungsten exposed to D plasma with different impurities

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2017
Elsevier Amsterdam [u.a.]

Nuclear materials and energy 12, 302-306 () [10.1016/j.nme.2016.11.001]

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Abstract: In this study the effect of impurities in deuterium plasma on the tungsten microstructure is investigated. W samples were exposed in the linear plasma generator PSI-2 at a sample temperature of 500 K with an incident ion flux of about 1022 m−2s−1, an incident ion fluence of 5 × 1025 m−2 and an incident ion energy of 70 eV. Samples were exposed to pure D+ plasma and with additional impurities of He (3%), Ar (7%), Ne (10%) or N (5%). After the PSI-2 exposure a part of each sample was additionally loaded with tritium to measure the tritium uptake using the imaging plate technique.The surface morphology was investigated using scanning electron microscope (SEM) combined with a focused ion beam (FIB) utilized for cross-sectioning and thin lamella preparation for the transmission electron microscope (TEM) analysis.Blistering with grain orientation dependence was observed on all exposed samples. Most pronounced blistering is reported for grains with orientation close to (111). The addition of Ar or Ne results in surface erosion with different yields depending on grain orientation. Highest erosion yield is observed for grains with orientation close to (100). Large blisters are present but show signatures of erosion. Less pronounced erosion is visible when adding N. The highest uptake of tritium was reported for the sample exposed to D+He plasma which corresponds to the largest – 18 nm, near surface damage zone revealed by TEM. Lowest tritium accumulation was observed for samples exposed to D+Ar and D+Ne plasmas, which corresponds to the shallowest near surface damage zone, as confirmed by TEM.

Classification:

Contributing Institute(s):
  1. Plasmaphysik (IEK-4)
Research Program(s):
  1. 174 - Plasma-Wall-Interaction (POF3-174) (POF3-174)

Appears in the scientific report 2017
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Creative Commons Attribution CC BY 4.0 ; DOAJ ; OpenAccess ; DOAJ Seal ; Emerging Sources Citation Index ; SCOPUS ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2017-01-31, last modified 2024-07-11