Journal Article

FZJ-2017-01960

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Surface conductivity of Si(100) and Ge(100) surfaces determined from four-point transport measurements using an analytical N -layer conductance model

Just, S.FZJ* ; Soltner, H.FZJ* ; Korte, S. ; Cherepanov, V.FZJ* ; Voigtländer, B. (Corresponding author)FZJ*

2017
American Physical Society Woodbury, NY

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Please use a persistent id in citations: http://hdl.handle.net/2128/13896  doi:10.1103/PhysRevB.95.075310

Abstract: An analytical N-layer model for charge transport close to a surface is derived from the solution of Poisson's equation and used to describe distance-dependent electrical four-point measurements on the microscale. As the N-layer model comprises a surface channel, multiple intermediate layers, and a semi-infinite bulk, it can be applied to semiconductors in combination with a calculation of the near-surface band bending to model very precisely the measured four-point resistance on the surface of a specific sample and to extract a value for the surface conductivity. For describing four-point measurements on sample geometries with mixed 2D-3D conduction channels, often a very simple parallel-circuit model has so far been used in the literature, but the application of this model is limited, as there are already significant deviations, when it is compared to the lowest possible case of the N-layer model, i.e., the three-layer model. Furthermore, the N-layer model is applied to published distance-dependent four-point resistance measurements obtained with a multitip scanning tunneling microscope (STM) on germanium(100) and silicon(100) with different bulk doping concentrations resulting in the determination of values for the surface conductivities of these materials.

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Contributing Institute(s):

1. Funktionale Nanostrukturen an Oberflächen (PGI-3)
2. Zentralinstitut für Technologie (ZEA-1)
3. JARA-FIT (JARA-FIT)

Research Program(s):

1. 141 - Controlling Electron Charge-Based Phenomena (POF3-141) (POF3-141)
2. 521 - Controlling Electron Charge-Based Phenomena (POF3-521) (POF3-521)

Appears in the scientific report 2017

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Database coverage:
; ; ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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