Journal Article

FZJ-2017-06683

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Response to the comment by C. Kisielowsky, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. van Dyck on the article "On the influence of the electron dose-rate on the HRTEM Image contrast" by J. Barthel, M. Lentzen, A. Thust

Barthel, J. (Corresponding author)FZJ* ; Lentzen, M.FZJ* ; Thust, A.FZJ*

2017
Elsevier Science Amsterdam

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Please use a persistent id in citations: doi:10.1016/j.ultramic.2017.04.004

Abstract: In a recent article [1] we examined the influence of the applied electron dose rate on the magnitude of the image contrast in high-resolution transmission electron microscopy (HRTEM). We concluded that the magnitude of the image contrast is not substantially affected by the applied electron dose rate. This result is in obvious contradiction to numerous earlier publications by Kisielowski and coworkers [2–7], who commented our recent article due to this contradiction. The present short communication is a response to the comment of Kisielowski and coworkers on our recent article, where we provide additional arguments supporting our initial findings and conclusions on the magnitude of the image contrast in HRTEM.

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Contributing Institute(s):

1. Physik Nanoskaliger Systeme (ER-C-1)
2. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2017

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Database coverage:
; BIOSIS Previews ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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