Journal Article FZJ-2018-02936

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Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution

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2018
APS College Park, Md.

Physical review letters 120(15), 15 - 13 () [10.1103/PhysRevLett.120.156101]

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Abstract: An absolute scale match between experiment and simulation in atomic-resolution off-axis electron holography is demonstrated, with unknown experimental parameters determined directly from the recorded electron wave function using an automated numerical algorithm. We show that the local thickness and tilt of a pristine thin WSe2 flake can be measured uniquely, whereas some electron optical aberrations cannot be determined unambiguously for a periodic object. The ability to determine local specimen and imaging parameters directly from electron wave functions is of great importance for quantitative studies of electrostatic potentials in nanoscale materials, in particular when performing in situ experiments and considering that aberrations change over time.

Classification:

Contributing Institute(s):
  1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)
  2. Physik Nanoskaliger Systeme (ER-C-1)
  3. JARA - HPC (JARA-HPC)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
  2. First principle calculations of transition metal dichalcogenides for spin-optoelectronics (jpgi90_20150501) (jpgi90_20150501)
  3. Novel materials for nanoelectronics and spintronics: first principle investigation. (jias16_20141101) (jias16_20141101)

Appears in the scientific report 2018
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 Record created 2018-05-14, last modified 2021-01-29