Hauptseite > Publikationsdatenbank > Trends in the valence band electronic structures of mixed uranium oxides |
Journal Article | FZJ-2018-05536 |
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2018
Soc.
Cambridge
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Please use a persistent id in citations: doi:10.1039/C8CC05464A
Abstract: The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.
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